Most of the papers are copyrighted by ACM or IEEE or Springer. They are posted here for your personal use, to ensure timely dissemination of research work with no commercial purpose
DBLP Link: ÍôÓń, EE Dept. Tsinghua University, Beijing, China
- [IEEE TDSC] Yu Wang, Hong Luo, Ku He, Rong Luo, Huazhong Yang, Yuan Xie, "Temperature-Aware NBTI Modeling and the Impact of Standby Leakage Reduction Techniques on Circuit Performance Degradation", to appear in IEEE Trans on Dependable and Security Computing.
- [IEEE TVLSI] Yu Wang , Ku He, Rong Luo, Hui Wang, Huazhong Yang, ˇ°Two-phase Fine-grain Sleep Transistor Insertion Technique in Leakage Critical Circuits,ˇ± in IEEE Transaction on VLSI, Volume 16, Issue 9, Sept. 2008 Page(s):1101 - 1113.
- [IEEE TVLSI] Yu Wang, Xiaoming Chen, Wenping Wang, Yu Cao, Yuan Xie, Huazhong Yang, "Leakage Power and Circuit Aging Co-Optimization by Gate Replacement Techniques", to appear in TVLSI.
- [CJE] Yu Wang , Hong Luo, Ku He, Rong Luo, Huazhong Yang, Yuan Xie, ˇ°NBTI-aware Dual Vth Assignment for Leakage Reduction and Lifetime Assurance,ˇ± in Chinese Journal of Electronics, Issue 2, Feb. 2009, pp: 225-230.
- [CJS] Huazhong Yang, Yu Wang , Hai Lin, Rong Luo, Hui Wang, ˇ°Fine-grain Sleep Transistor Insertion for Leakage Reduction,ˇ± in Chinese Journal of Semiconductors, 2006, Vol.27, No.2, pp:258-265.
- [JCSC] Yu Wang ,Huazhong Yang, Hui Wang, ˇ°Signal-path Level Dual-Vt Assignment for Leakage Power Reduction,ˇ± [pdf] in Journal of Circuits, System and Computers, 2006, Vol. 15, No. 2, pp:179-216.
- [JCSC] Yu Wang, Xukai Shen, Rong Luo, Huazhong Yang, Leakage power reduction through Dual Vth assignment considering threshold voltage variation, in Journal of Circuits, Systems and Computers, 18(7), pp 1243-1261, 2009/11.
- [IEICE] Hong Luo, Yu Wang, Rong Luo, Huazhong Yang and Yuan Xie," Temperature-aware NBTI Modeling Techniques in Digital Circuits ", in IEICE Trans. on Electronics, E92C(6), pp 875-886, 2009/6.
- [IEICE] Yuchun Ma, Xin Li, Yu Wang, Xianlong Hong, "Thermal- Aware Incremental Floorplanning for 3D ICs based on MILP Formulation", to appear in IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences.
- [JEC] Hong Luo, Yu Wang, Rong Luo, Huazhong Yang, "Software Tools for Analyzing NBTI-induced Digital Circuit Degradation," in Journal of Electronics (China), Volume 26, Number 5, 2009.09, pp.715-719. .
- [JEST] Bo Zhao, Yu Wang, Huazhong Yang, and Hui Wang, "The NBTI Impact on RF Front End in Wireless Sensor Networks", to appear in Journal of Electronic Science and Technology.
- [IJE] Qian Ding, Yu Wang, Hui Wang, Rong Luo, Huazhong Yang, SERSim: a Soft Error Rate Simulator and a Case Study for a 32-bit OpenRisc 1200 Microprocessor, to appear in International Journal of Electronics.
- [IET CDT] Qian Ding, Yu Wang , Hui Wang, Rong Luo, Huazhong Yang, Output Remapping Technique for Critical Paths Soft-Error Rate Reduction, to appear in IET Computers & Digital Techniques.
- [IET CDS] Guangming Yu, Yu Wang, Huazhong Yang, Hui Wang, "Fast-Locking All-Digital Phase-Locked Loop with Digitally Controlled Oscillator Tuning Word Estimating and Presetting", to appear in IET CDS.
- [Springer IJPP] Michael DeBole, Ramakrishnan Krishnan, Varsha Balakrishnan, Wenping Wang, Luo Hong, Yu Wang, Yuan Xie , Yu Cao, N. Vijaykrishnan, " NewAge: A Framework for Estimating NBTI Degradation of Microarchitectural Components",? in International Journal of Parallel Programming, Volume 37, Number 4, 2009.08, pp 417-431.
- [submitted to JS] Qian Ding, Yu Wang , Hui Wang, Rong Luo, Huazhong Yang, Soft Error Generation Analysis in Combinational Logic Circuits, submitted to Journal of Semiconductors.
- [submitted to TVLSI] Yu Wang, Jiang Xu, Yan Xu, Weichen Liu, Huazhong Yang, " Power Gating Aware Task Scheduling in MPSoC", submitted to TVLSI (major revision).